中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
首页 机构 成果 学者
  
  1. CAS IR Grid
  2. 计算技术研究所
  3. 中国科学院计算技术研究所
  4. 中国科学院计算技术研究所期刊论文
  5. 英文
LMDet: A "Naturalness" Statistical Method for Hardware Trojan Detection

文献类型：期刊论文

作者Shen, Haihua1,3; Tan, Huazhe1,3; Li, Huawei2; Zhang, Feng4; Li, Xiaowei2
刊名IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
出版日期2018-04-01
卷号26期号:4页码:720-732
关键词Hardware Trojan (HT) detection natural language processing (NLP) n-gram language model statistical analysis
ISSN号1063-8210
DOI10.1109/TVLSI.2017.2781423
英文摘要Hardware Trojans (HTs) are emerging threats for integrated circuits. In this paper, we propose a novel scheme, named LMDet, to detect HTs through distinguishing the "unnaturalness" of HTs from the "naturalness" of normal circuits using the natural language processing technology. The key insight of LMDet is that we find clean circuits tend to be "natural" (i.e., to be highly repetitive in structure) and HTs appear to be "unnatural" (i.e., to be rare in structure) in some sense. LMDet models circuit gates sequentially, using the n-gram language model. Gate sequences from the circuit under detection (CUD) are assessed according to their probability in the model, and low-probability sequences are marked as suspected Trojan-related gates. Evaluation with benchmarks and industrial circuits shows that LMDet is capable of detecting Trojan logic without the HT-free reference of CUD. LMDet has short execution time on large commercial circuits with acceptable space overhead. It is a promising method in real industry since plenty of HT-free designs are available as training corpus to ensure good statistical effects.
资助项目National Natural Science Foundation of China[61432017] ; National Natural Science Foundation of China[61474134] ; National Natural Science Foundation of China[61532017] ; National Key Research and Development Program of China[2016YFF0203500]
WOS研究方向Computer Science ; Engineering
语种英语
WOS记录号WOS:000428615000011
出版者IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
源URL[http://119.78.100.204/handle/2XEOYT63/5751]  
专题中国科学院计算技术研究所期刊论文_英文
通讯作者Shen, Haihua; Li, Huawei
作者单位1.Univ Chinese Acad Sci, Beijing 100190, Peoples R China
2.Chinese Acad Sci, Inst Comp Technol, State Key Lab Comp Architecture, Beijing 100190, Peoples R China
3.Beihang Univ, State Key Lab Software Dev Environm, Beijing 100083, Peoples R China
4.Chinese Acad Sci, Inst Microelect, Beijing 100190, Peoples R China
推荐引用方式
GB/T 7714		 Shen, Haihua,Tan, Huazhe,Li, Huawei,et al. LMDet: A "Naturalness" Statistical Method for Hardware Trojan Detection[J]. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS,2018,26(4):720-732.
APA Shen, Haihua,Tan, Huazhe,Li, Huawei,Zhang, Feng,&Li, Xiaowei.(2018).LMDet: A "Naturalness" Statistical Method for Hardware Trojan Detection.IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS,26(4),720-732.
MLA Shen, Haihua,et al."LMDet: A "Naturalness" Statistical Method for Hardware Trojan Detection".IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS 26.4(2018):720-732.

入库方式： OAI收割

来源：计算技术研究所

浏览0
下载0
收藏0
其他版本

除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。