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Functional Test Generation for Hard-to-Reach States Using Path Constraint Solving

文献类型：期刊论文

作者Zhou, Yanhong1,2; Wang, Tiancheng1,2; Li, Huawei2; Lv, Tao2; Li, Xiaowei2
刊名IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
出版日期2016-06-01
卷号35期号:6页码:999-1011
关键词Abstraction-guided simulation functional test generation hard-to-reach states path constraint solving
ISSN号0278-0070
DOI10.1109/TCAD.2015.2481863
英文摘要Test generation for hard-to-reach states is important in functional verification. In this paper, we present a path constraint solving-based test generation method (PACOST) which operates in an abstraction-guided semiformal verification framework to cover hard-to-reach states. PACOST combines concrete simulation and symbolic simulation on the design under verification for path constraint extraction and mutation, and uses a sequential path constraint extractor to generate a set of valid input vectors for exploring different simulation paths with different next states. It then works on a target state-oriented abstract model to select the next state with the smallest abstract distance. In addition, the value of register variables in control logic can be controlled by analyzing the data dependence between variables, which helps the simulation converge to the target states. Experimental results show that PACOST can generate shorter traces reaching hard-to-reach states, in comparison with previous abstraction-guided semiformal methods.
资助项目National Natural Science Foundation of China[61432017] ; National Natural Science Foundation of China[61176040] ; National Natural Science Foundation of China[61221062] ; National Basic Research Program of China (973)[2011CB302501]
WOS研究方向Computer Science ; Engineering
语种英语
WOS记录号WOS:000377105700010
出版者IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
源URL[http://119.78.100.204/handle/2XEOYT63/8400]  
专题中国科学院计算技术研究所期刊论文_英文
通讯作者Li, Huawei
作者单位1.Univ Chinese Acad Sci, Beijing 100190, Peoples R China
2.Chinese Acad Sci, Inst Comp Technol, State Key Lab Comp Architecture, Beijing 100190, Peoples R China
推荐引用方式
GB/T 7714		 Zhou, Yanhong,Wang, Tiancheng,Li, Huawei,et al. Functional Test Generation for Hard-to-Reach States Using Path Constraint Solving[J]. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS,2016,35(6):999-1011.
APA Zhou, Yanhong,Wang, Tiancheng,Li, Huawei,Lv, Tao,&Li, Xiaowei.(2016).Functional Test Generation for Hard-to-Reach States Using Path Constraint Solving.IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS,35(6),999-1011.
MLA Zhou, Yanhong,et al."Functional Test Generation for Hard-to-Reach States Using Path Constraint Solving".IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 35.6(2016):999-1011.

入库方式： OAI收割

来源：计算技术研究所

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