CoreRank: Redeeming "Sick Silicon" by Dynamically Quantifying Core-Level Healthy Condition
文献类型：期刊论文
| 作者 | Yan, Guihai; Sun, Faqiang; Li, Huawei; Li, Xiaowei |
| 刊名 | IEEE TRANSACTIONS ON COMPUTERS
 |
| 出版日期 | 2016-03-01 |
| 卷号 | 65期号:3页码:716-729 |
| ISSN号 | 0018-9340 |
| 关键词 | Reliability heterogeneity healthy condition manycore processor |
| DOI | 10.1109/TC.2015.2479619 |
| 英文摘要 | In field degradation of manycore processors poses a grand challenge to core management, largely because the degradation is hard to quantify. We propose a novel core-level degradation quantification scheme, CoreRank, to facilitate the management. We first develop a new degradation metric, called "healthy condition", to capture the implication of performance degradation of a core with specific degraded components. Then, we propose a performance sampling scheme by using micro-operation streams, called snippet, to statistically quantify cores' healthy condition. We find that similar snippets exhibit stable performance distribution, which makes them ideal micro-benchmarks to testify the core-level healthy conditions. We develop a hardware-implemented version of CoreRank based on bloom filter and hash table. Unlike the traditional "faulty" or "fault-free" judgement, CoreRank provides a key facility to make better use of those imperfect cores that suffered from various progressive aging mechanisms such as NBTI, HCI. Experimental results show that CoreRank successfully hides significant performance degradation of a defective manycore processor in which even more than half of the cores are salvaged from various defects. |
| 资助项目 | National Basic Research Program of China (973)[2011CB302503] ; NSFC[61221062] ; NSFC[61376043] ; NSFC[61432017] ; NSFC[61572470] ; NSFC[61532017] |
| WOS研究方向 | Computer Science ; Engineering |
| 语种 | 英语 |
| 出版者 | IEEE COMPUTER SOC |
| WOS记录号 | WOS:000370729600005 |
| 源URL | [http://119.78.100.204/handle/2XEOYT63/8778]  |
| 专题 | 中国科学院计算技术研究所期刊论文_英文 |
| 通讯作者 | Yan, Guihai; Sun, Faqiang; Li, Huawei; Li, Xiaowei |
| 作者单位 | Chinese Acad Sci, Inst Comp Technol, State Key Lab Comp Architecture, Beijing 100190, Peoples R China |
| 推荐引用方式 GB/T 7714 | Yan, Guihai,Sun, Faqiang,Li, Huawei,et al. CoreRank: Redeeming "Sick Silicon" by Dynamically Quantifying Core-Level Healthy Condition[J]. IEEE TRANSACTIONS ON COMPUTERS,2016,65(3):716-729. |
| APA | Yan, Guihai,Sun, Faqiang,Li, Huawei,&Li, Xiaowei.(2016).CoreRank: Redeeming "Sick Silicon" by Dynamically Quantifying Core-Level Healthy Condition.IEEE TRANSACTIONS ON COMPUTERS,65(3),716-729. |
| MLA | Yan, Guihai,et al."CoreRank: Redeeming "Sick Silicon" by Dynamically Quantifying Core-Level Healthy Condition".IEEE TRANSACTIONS ON COMPUTERS 65.3(2016):716-729. |
入库方式： OAI收割
来源：计算技术研究所
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