Embedded test decompressor to reduce the required channels and vector memory of tester for complex processor circuit
文献类型：期刊论文
| 作者 | Han, Yinhe; Hu, Yu; Li, Xiaowei; Li, Huawei; Chandra, Anshuman |
| 刊名 | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
 |
| 出版日期 | 2007-05-01 |
| 卷号 | 15期号:5页码:531-540 |
| 关键词 | automatic test equipment (ATE) Godson processor MUX network test stimulus decompression |
| ISSN号 | 1063-8210 |
| DOI | 10.1109/TVLSI.2007.893652 |
| 英文摘要 | An embedded test stimulus decompressor is presented for the test patterns decompression, which can reduce the required channels and vector memory of automatic test equipment (ATE) for complex processor circuit. The proposed decompressor mainly consists of a periodically alterable MUX network which has multiple configurations to decode the input information flexibly and efficiently. In order to reduce the number of test patterns and configurations, a test patterns compaction algorithm, using CI-Graph merging, is proposed. With the proposed periodically alterable MUX network and the patterns compaction algorithm, smaller test data volume and required external pins can be achieved as compared to previous techniques. |
| WOS研究方向 | Computer Science ; Engineering |
| 语种 | 英语 |
| WOS记录号 | WOS:000246894500005 |
| 出版者 | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
| 源URL | [http://119.78.100.204/handle/2XEOYT63/11028]  |
| 专题 | 中国科学院计算技术研究所期刊论文_英文 |
| 通讯作者 | Han, Yinhe |
| 作者单位 | 1.Chinese Acad Sci, Inst Comp Technol, Key Lab Comp Syst & Architecture, Beijing 100080, Peoples R China 2.Synopsys Inc, Dept Res & Dev, Mountain View, CA 94043 USA |
| 推荐引用方式 GB/T 7714 | Han, Yinhe,Hu, Yu,Li, Xiaowei,et al. Embedded test decompressor to reduce the required channels and vector memory of tester for complex processor circuit[J]. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS,2007,15(5):531-540. |
| APA | Han, Yinhe,Hu, Yu,Li, Xiaowei,Li, Huawei,&Chandra, Anshuman.(2007).Embedded test decompressor to reduce the required channels and vector memory of tester for complex processor circuit.IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS,15(5),531-540. |
| MLA | Han, Yinhe,et al."Embedded test decompressor to reduce the required channels and vector memory of tester for complex processor circuit".IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS 15.5(2007):531-540. |
入库方式： OAI收割
来源：计算技术研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。