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Design-for-Testability Features and Test Implementation of a Giga Hertz General Purpose Microprocessor

文献类型：期刊论文

作者Wang, Da1,2; Hu, Yu1; Li, Hua-Wei1; Li, Xiao-Wei1
刊名JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY
出版日期2008-11-01
卷号23期号:6页码:1037-1046
关键词microprocessor design-for-testability test generation built-in self-test at-speed testing
ISSN号1000-9000
DOI10.1007/s11390-008-9193-0
英文摘要This paper describes the design-for-testability (DFT) features and low-cost testing solutions of a general purpose microprocessor. The optimized DFT features are presented in detail. A hybrid scan compression structure was executed and achieved compression ratio more than ten times. Memory built-in self-test (BIST) circuitries were designed with scan collars instead of bitmaps to reduce area overheads and to improve test and debug efficiency. The implemented DFT framework also utilized internal phase-locked loops (PLL) to provide complex at-speed test clock sequences. Since there are still limitations in this DFT design, the test strategies for this case are quite complex, with complicated automatic test pattern generation (ATPG) and debugging flow. The sample testing results are given in the paper. All the DFT methods discussed in the paper are prototypes for a high-volume manufacturing (HVM) DFT plan to meet high quality test goals as well as slow test power consumption and cost.
资助项目National Natural Science Foundation of China[60633060] ; National Natural Science Foundation of China[60606008] ; National Natural Science Foundation of China[60776031] ; National Natural Science Foundation of China[60803031] ; National Natural Science Foundation of China[90607010] ; National Basic Research 973 Program of China[2005CB321604] ; National Basic Research 973 Program of China[2005CB321605] ; National High Technology Research and Development 863 Program of China[2007AA01Z107] ; National High Technology Research and Development 863 Program of China[2007AA01Z113] ; National High Technology Research and Development 863 Program of China[2007AA01Z476]
WOS研究方向Computer Science
语种英语
WOS记录号WOS:000261179300013
出版者SCIENCE PRESS
源URL[http://119.78.100.204/handle/2XEOYT63/11404]  
专题中国科学院计算技术研究所期刊论文_英文
通讯作者Li, Xiao-Wei
作者单位1.Chinese Acad Sci, Inst Comp Technol, Key Lab Comp Syst & Architecture, Beijing 100190, Peoples R China
2.Chinese Acad Sci, Grad Univ, Beijing 100049, Peoples R China
推荐引用方式
GB/T 7714		 Wang, Da,Hu, Yu,Li, Hua-Wei,et al. Design-for-Testability Features and Test Implementation of a Giga Hertz General Purpose Microprocessor[J]. JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY,2008,23(6):1037-1046.
APA Wang, Da,Hu, Yu,Li, Hua-Wei,&Li, Xiao-Wei.(2008).Design-for-Testability Features and Test Implementation of a Giga Hertz General Purpose Microprocessor.JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY,23(6),1037-1046.
MLA Wang, Da,et al."Design-for-Testability Features and Test Implementation of a Giga Hertz General Purpose Microprocessor".JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY 23.6(2008):1037-1046.

入库方式： OAI收割

来源：计算技术研究所

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