Co-optimization of Dynamic/Static Test Power in Scan Test
文献类型：期刊论文
| 作者 | Wang Wei1,2; Han Yinhe2; Li Xiaowei2; Fang Fang1,2,3 |
| 刊名 | CHINESE JOURNAL OF ELECTRONICS
 |
| 出版日期 | 2009 |
| 卷号 | 18期号:1页码:54-58 |
| 关键词 | Co-optimization Test power Blocking logic Minimum leakage vector |
| ISSN号 | 1022-4653 |
| 英文摘要 | Low-power design has become a challenge of test. We propose an effective low-power scan architecture named PowerSluice to minimize power consumption during scan test, which is based on scan chain modifications. On one hand, a kind of blocking logic is inserted into the scan chain to reduce the dynamic power and two kinds of controlling units are also inserted to decrease the leakage power during the shift cycle. On the other hand, using genetic algorithm, the exact values of control signals are found out to control the process. Experiments results indicate that this architecture can effectually reduce power during scan test with probably minimum area cost. |
| 资助项目 | National High-Tech Research and Development Plan of China (863)[2007AA01Z113] ; National Natural Science Foundation of China (NSFC)[60606008] ; National Natural Science Foundation of China (NSFC)[60633060] ; National Natural Science Foundation of China (NSFC)[90607010] ; National Natural Science Foundation of China (NSFC)[60576031] ; National Natural Science Foundation of China (NSFC)[60876028] ; National Basic Research Program of China (973)[2005CB321605] ; National Basic Research Program of China (973)[2005CB321604] ; Key Laboratory of Computer System and Architecture, Institute of Computing Technology, Chinese Academy of Sciences[ICT-ARCH200704] ; China Postdoctoral Science Foundation[20080430050] ; Hefei University of Technology[070501F] |
| WOS研究方向 | Engineering |
| 语种 | 英语 |
| WOS记录号 | WOS:000262975200010 |
| 出版者 | TECHNOLOGY EXCHANGE LIMITED HONG KONG |
| 源URL | [http://119.78.100.204/handle/2XEOYT63/11907]  |
| 专题 | 中国科学院计算技术研究所期刊论文_英文 |
| 通讯作者 | Wang Wei |
| 作者单位 | 1.Hefei Univ Technol, Sch Comp & Informat, Hefei 230009, Peoples R China 2.Chinese Acad Sci, Inst Comp Technol, Key Lab Comp Syst & Architecture, Beijing 100080, Peoples R China 3.Hefei Univ Technol, Sch Management, Hefei 230009, Peoples R China |
| 推荐引用方式 GB/T 7714 | Wang Wei,Han Yinhe,Li Xiaowei,et al. Co-optimization of Dynamic/Static Test Power in Scan Test[J]. CHINESE JOURNAL OF ELECTRONICS,2009,18(1):54-58. |
| APA | Wang Wei,Han Yinhe,Li Xiaowei,&Fang Fang.(2009).Co-optimization of Dynamic/Static Test Power in Scan Test.CHINESE JOURNAL OF ELECTRONICS,18(1),54-58. |
| MLA | Wang Wei,et al."Co-optimization of Dynamic/Static Test Power in Scan Test".CHINESE JOURNAL OF ELECTRONICS 18.1(2009):54-58. |
入库方式： OAI收割
来源：计算技术研究所
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