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A Novel Post-Silicon Debug Mechanism Based on Suspect Window

文献类型：期刊论文

作者Jianliang Gao1,2; Yinhe Han1,2; Xiaowei Li1,2
刊名IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS
出版日期2010-05-01
卷号E93D期号:5页码:1175-1185
关键词debug scan dump real-time trace suspect window
ISSN号0916-8532
DOI10.1587/transinf.E93.D.1175
英文摘要Bugs are becoming unavoidable in complex integrated circuit design. It is imperative to identify the bugs as soon as possible through post-silicon debug. For post-silicon debug, observability is one of the biggest challenges. Scan-based debug mechanism provides high observability by reusing scan chains. However, it is not feasible to scan dump cycle-by-cycle during program execution due to the excessive time required. In fact, it is not necessary to scan out the error-free states. In this paper, we introduce Suspect Window to cover the clock cycle in which the bug is triggered. Then, we present an efficient approach to determine the suspect window. Based on Suspect Window, we propose a novel debug mechanism to locate the bug both temporally and spatially. Since scan dumps are only taken in the suspect window with the proposed mechanism, the time required for locating the bug is greatly reduced. The approaches are evaluated using ISCAS'89 and ITC'99 benchmark circuits. The experimental results show that the proposed mechanism can significantly reduce the overall debug time compared to scan-based debug mechanism while keeping high observability.
WOS研究方向Computer Science
语种英语
WOS记录号WOS:000279136500026
出版者IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG
源URL[http://119.78.100.204/handle/2XEOYT63/12001]  
专题中国科学院计算技术研究所期刊论文_英文
通讯作者Jianliang Gao
作者单位1.Chinese Acad Sci, Inst Comp Technol, Key Lab Comp Syst & Architecture, Beijing, Peoples R China
2.Chinese Acad Sci, Grad Univ, Beijing, Peoples R China
推荐引用方式
GB/T 7714		 Jianliang Gao,Yinhe Han,Xiaowei Li. A Novel Post-Silicon Debug Mechanism Based on Suspect Window[J]. IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS,2010,E93D(5):1175-1185.
APA Jianliang Gao,Yinhe Han,&Xiaowei Li.(2010).A Novel Post-Silicon Debug Mechanism Based on Suspect Window.IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS,E93D(5),1175-1185.
MLA Jianliang Gao,et al."A Novel Post-Silicon Debug Mechanism Based on Suspect Window".IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS E93D.5(2010):1175-1185.

入库方式： OAI收割

来源：计算技术研究所

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