X-Filling for Simultaneous Shift- and Capture-Power Reduction in At-Speed Scan-Based Testing
文献类型：期刊论文
| 作者 | Li, Jia1,2; Xu, Qiang3,4,5; Hu, Yu; Li, Xiaowei1 |
| 刊名 | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
 |
| 出版日期 | 2010-07-01 |
| 卷号 | 18期号:7页码:1081-1092 |
| 关键词 | At-speed scan-based testing low-power testing X-filling |
| ISSN号 | 1063-8210 |
| DOI | 10.1109/TVLSI.2009.2019980 |
| 英文摘要 | Power consumption during at-speed scan-based testing can be significantly higher than that during normal functional mode in both shift and capture phases, which can cause circuits' reliability concerns during manufacturing test. This paper proposes a novel X-filling technique, namely "iFill", to address the above issue, by analyzing the impact of X-bits on switching activities of the circuit nodes in the two different phases. In addition, different from prior X-filling methods for shift-power reduction that can only reduce shift-in power, our method is able to cut down power consumptions in both shift-in and shift-out processes. Experimental results on benchmark circuits show that the proposed technique can guarantee the power safety in both shift and capture phases during at-speed scan-based testing. |
| 资助项目 | National Natural Science Foundation of China[60633060] ; National Natural Science Foundation of China[60803031] ; National Natural Science Foundation of China[90607010] ; National High Technology Research and Development Program of China (863 program)[2007AA01Z107] ; National High Technology Research and Development Program of China (863 program)[2007AA01Z113] ; National High Technology Research and Development Program of China (863 program)[2007AA01Z109] ; National Basic Research Program of China (973 program)[2005CB321604] ; National Basic Research Program of China (973 program)[2005CB321605] ; Hong Kong SAR Research Grants Council (RGC)[CUHK417406] ; Hong Kong SAR Research Grants Council (RGC)[CUHK417807] ; Hong Kong SAR Research Grants Council (RGC)[CUHK418708] ; NSFC[60876029] ; NSFC/RGC[N_CUHK417/08] |
| WOS研究方向 | Computer Science ; Engineering |
| 语种 | 英语 |
| WOS记录号 | WOS:000278996600006 |
| 出版者 | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
| 源URL | [http://119.78.100.204/handle/2XEOYT63/12042]  |
| 专题 | 中国科学院计算技术研究所期刊论文_英文 |
| 通讯作者 | Li, Jia |
| 作者单位 | 1.Chinese Acad Sci, Inst Comp Technol, Key Lab Comp Syst & Architecture, Beijing 100190, Peoples R China 2.Chinese Acad Sci, Grad Univ, Beijing 100190, Peoples R China 3.Chinese Univ Hong Kong, Dept Comp Sci & Engn, CUHK Reliable Comp Lab CURE, Shatin, Hong Kong, Peoples R China 4.Chinese Univ Hong Kong, Dept Comp Sci & Engn, CUHK Reliable Comp Lab, CURE Lab, Hong Kong, Hong Kong, Peoples R China 5.CAS CUHK Shenzhen Inst Adv Integrat Technol, Shenzhen 518055, Peoples R China |
| 推荐引用方式 GB/T 7714 | Li, Jia,Xu, Qiang,Hu, Yu,et al. X-Filling for Simultaneous Shift- and Capture-Power Reduction in At-Speed Scan-Based Testing[J]. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS,2010,18(7):1081-1092. |
| APA | Li, Jia,Xu, Qiang,Hu, Yu,&Li, Xiaowei.(2010).X-Filling for Simultaneous Shift- and Capture-Power Reduction in At-Speed Scan-Based Testing.IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS,18(7),1081-1092. |
| MLA | Li, Jia,et al."X-Filling for Simultaneous Shift- and Capture-Power Reduction in At-Speed Scan-Based Testing".IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS 18.7(2010):1081-1092. |
入库方式： OAI收割
来源：计算技术研究所
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