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Scan chain design for shift power reduction in scan-based testing

文献类型：期刊论文

作者Li Jia2; Hu Yu1; Li XiaoWei1
刊名SCIENCE CHINA-INFORMATION SCIENCES
出版日期2011-04-01
卷号54期号:4页码:767-777
关键词low power DfT scan-based testing test power reduction scan chain design
ISSN号1674-733X
DOI10.1007/s11432-011-4205-z
英文摘要Test power of VLSI systems has become a challenging issue nowadays. The scan shift power dominates the average test power and restricts clock frequency of the shift phase, leading to excessive thermal accumulation and long test time. This paper proposes a scan chain design technique to solve the above problems. Based on weighted transition metric (WTM), the proposed extended WTM (EWTM) that is utilized to guide the scan chain design algorithm can estimate the scan shift power in both the shift-in and shift-out phases. Moreover, the wire length overhead of the proposed scan chain design can also be reduced by the proposed distance of EWTM (DEWTM) metric. Experimental results confirm that the proposed approach can significantly reduce scan shift power with low wire length overhead.
资助项目National Natural Science Foundation of China[60633060] ; National Natural Science Foundation of China[60803031] ; National Natural Science Foundation of China[61006017] ; National Basic Research Program of China[2005CB321604] ; National High-Tech Research & Development Program of China[2007AA01Z107] ; National High-Tech Research & Development Program of China[2007AA01Z113] ; National High-Tech Research & Development Program of China[2007AA01Z109] ; National High-Tech Research & Development Program of China[2009AA01Z129] ; National Science Foundation of China[60425203] ; National Science Foundation of China[60910003] ; Key Laboratory of Computer System and Architecture, ICT, CAS[ICT-ARCH200902] ; China Postdoctoral Science Foundation[20100470014]
WOS研究方向Computer Science
语种英语
WOS记录号WOS:000289902100006
出版者SCIENCE CHINA PRESS
源URL[http://119.78.100.204/handle/2XEOYT63/12575]  
专题中国科学院计算技术研究所期刊论文_英文
通讯作者Li Jia
作者单位1.Chinese Acad Sci, Inst Comp Technol, Beijing 100190, Peoples R China
2.Tsinghua Univ, Sch Software, Beijing 100084, Peoples R China
推荐引用方式
GB/T 7714		 Li Jia,Hu Yu,Li XiaoWei. Scan chain design for shift power reduction in scan-based testing[J]. SCIENCE CHINA-INFORMATION SCIENCES,2011,54(4):767-777.
APA Li Jia,Hu Yu,&Li XiaoWei.(2011).Scan chain design for shift power reduction in scan-based testing.SCIENCE CHINA-INFORMATION SCIENCES,54(4),767-777.
MLA Li Jia,et al."Scan chain design for shift power reduction in scan-based testing".SCIENCE CHINA-INFORMATION SCIENCES 54.4(2011):767-777.

入库方式： OAI收割

来源：计算技术研究所

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