Statistical lifetime reliability optimization considering joint effect of process variation and aging
文献类型：期刊论文
| 作者 | Jin, Song1,2; Han, Yinhe1,2; Li, Huawei1,2; Li, Xiaowei1,2 |
| 刊名 | INTEGRATION-THE VLSI JOURNAL
 |
| 出版日期 | 2011-06-01 |
| 卷号 | 44期号:3页码:185-191 |
| 关键词 | Lifetime reliability Process variation NBTI Duty cycle Gate sizing |
| ISSN号 | 0167-9260 |
| DOI | 10.1016/j.vlsi.2011.03.004 |
| 英文摘要 | Aging effect degrades circuit performance in the runtime, interacts with fabrication-induced device parameter variation, and thus posing significant impact on circuit lifetime reliability. In this work, a statistical circuit optimization flow is proposed to ensure lifetime reliability of the manufactured chip in the presence of process variation and aging effects. It exploits a variation-aware gate-level statistical aging degradation model to characterize circuit lifetime reliability, identifies a set of worst duty cycles on the inputs of statistically critical gates to estimate the worst delay degradations on these gates. Based on the delay degradation information, statistical gate sizing is performed which enables the manufactured chip to satisfy lifetime reliability constraint in term of low area overhead. (C) 2011 Elsevier B.V. All rights reserved. |
| 资助项目 | National Basic Research Program of China (973)[2011CB302503] ; National Natural Science Foundation of China (NSFC)[60806014] ; National Natural Science Foundation of China (NSFC)[61076037] ; National Natural Science Foundation of China (NSFC)[60906018] ; National Natural Science Foundation of China (NSFC)[60921002] ; National Natural Science Foundation of China (NSFC)[60831160526] |
| WOS研究方向 | Computer Science ; Engineering |
| 语种 | 英语 |
| WOS记录号 | WOS:000292011900004 |
| 出版者 | ELSEVIER SCIENCE BV |
| 源URL | [http://119.78.100.204/handle/2XEOYT63/12690]  |
| 专题 | 中国科学院计算技术研究所期刊论文_英文 |
| 通讯作者 | Li, Huawei |
| 作者单位 | 1.Chinese Acad Sci, Key Lab Comp Syst & Architecture, Inst Comp Technol, Beijing, Peoples R China 2.Chinese Acad Sci, Grad Univ, Beijing, Peoples R China |
| 推荐引用方式 GB/T 7714 | Jin, Song,Han, Yinhe,Li, Huawei,et al. Statistical lifetime reliability optimization considering joint effect of process variation and aging[J]. INTEGRATION-THE VLSI JOURNAL,2011,44(3):185-191. |
| APA | Jin, Song,Han, Yinhe,Li, Huawei,&Li, Xiaowei.(2011).Statistical lifetime reliability optimization considering joint effect of process variation and aging.INTEGRATION-THE VLSI JOURNAL,44(3),185-191. |
| MLA | Jin, Song,et al."Statistical lifetime reliability optimization considering joint effect of process variation and aging".INTEGRATION-THE VLSI JOURNAL 44.3(2011):185-191. |
入库方式： OAI收割
来源：计算技术研究所
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