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Capture-power-aware test data compression using selective encoding

文献类型：期刊论文

作者Li, Jia2; Liu, Xiao3; Zhang, Yubin3,4; Hu, Yu; Li, Xiaowei1; Xu, Qiang3,4
刊名INTEGRATION-THE VLSI JOURNAL
出版日期2011-06-01
卷号44期号:3页码:205-216
关键词Test compression Low-power testing Scan-based testing
ISSN号0167-9260
DOI10.1016/j.vlsi.2011.01.005
英文摘要Ever-increasing test data volume and excessive test power are two of the main concerns of VLSI testing. The "don't-care" bits (also known as X-bits) in given test cube can be exploited for test data compression and/or test power reduction, and these techniques may contradict to each other because the very same X-bits are likely to be used for different optimization objectives. This paper proposes a capture-power-aware test compression scheme that is able to keep capture-power under a safe limit with low test compression ratio loss. Experimental results on benchmark circuits validate the effectiveness of the proposed solution. (C) 2011 Elsevier B.V. All rights reserved.
资助项目National Natural Science Foundation of China[60425203] ; National Natural Science Foundation of China[60803031] ; National Natural Science Foundation of China[60876029] ; National Natural Science Foundation of China[60910003] ; National Natural Science Foundation of China[61006017] ; National Natural Science Foundation of China[61076018] ; NSFC/RGC[N_CUHK417/08] ; National Basic Research Program of China[2011C8302503] ; National High-Tech Research & Development Program of China[2009AA01Z129] ; Key Laboratory of Computer System and Architecture, ICT, CAS[ICT-ARCH200902] ; China Postdoctoral Science Foundation[20100470014] ; Hong Kong SAR Research Grants Council (RGC)[CUHK417807]
WOS研究方向Computer Science ; Engineering
语种英语
WOS记录号WOS:000292011900006
出版者ELSEVIER SCIENCE BV
源URL[http://119.78.100.204/handle/2XEOYT63/12896]  
专题中国科学院计算技术研究所期刊论文_英文
通讯作者Li, Jia
作者单位1.Chinese Acad Sci, Inst Comp Technol, Key Lab Comp Syst & Architecture, Beijing, Peoples R China
2.Tsinghua Univ, Sch Software, Beijing 100084, Peoples R China
3.Chinese Univ Hong Kong, Dept Comp Sci & Engn, Shatin, Hong Kong, Peoples R China
4.CAS CUHK Shenzhen Inst Adv Technol, Shenzhen, Peoples R China
推荐引用方式
GB/T 7714		 Li, Jia,Liu, Xiao,Zhang, Yubin,et al. Capture-power-aware test data compression using selective encoding[J]. INTEGRATION-THE VLSI JOURNAL,2011,44(3):205-216.
APA Li, Jia,Liu, Xiao,Zhang, Yubin,Hu, Yu,Li, Xiaowei,&Xu, Qiang.(2011).Capture-power-aware test data compression using selective encoding.INTEGRATION-THE VLSI JOURNAL,44(3),205-216.
MLA Li, Jia,et al."Capture-power-aware test data compression using selective encoding".INTEGRATION-THE VLSI JOURNAL 44.3(2011):205-216.

入库方式： OAI收割

来源：计算技术研究所

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