I-DDT testing versus I-DDQ testing
文献类型：期刊论文
| 作者 | Min, YH; Li, ZC |
| 刊名 | JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
 |
| 出版日期 | 1998-08-01 |
| 卷号 | 13期号:1页码:51-55 |
| 关键词 | I-DDQ test Boolean process stuck-open fault I-DDT test |
| ISSN号 | 0923-8174 |
| 英文摘要 | I-DDQ testing has progressed to become a worldwide accepted test method to detect CMOS IC defects. However, it is noticed that observing the average transient current can lead to improvements in real defect coverage, which is referred to I-DDT testing. This letter presents a formal procedure to identify I-DDT testable faults, and to generate input vector pairs to detect the faults based on Boolean process. It is interesting to note that those faults may not be detected by I-DDQ or other test methods, which shows the significance of I-DDT testing. |
| WOS研究方向 | Engineering |
| 语种 | 英语 |
| WOS记录号 | WOS:000077635800006 |
| 出版者 | KLUWER ACADEMIC PUBL |
| 源URL | [http://119.78.100.204/handle/2XEOYT63/13276]  |
| 专题 | 中国科学院计算技术研究所期刊论文_英文 |
| 通讯作者 | Min, YH |
| 作者单位 | Chinese Acad Sci, Comp Technol Inst, CAD Lab, Ctr Fault Tolerant Comp, Beijing 100080, Peoples R China |
| 推荐引用方式 GB/T 7714 | Min, YH,Li, ZC. I-DDT testing versus I-DDQ testing[J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS,1998,13(1):51-55. |
| APA | Min, YH,&Li, ZC.(1998).I-DDT testing versus I-DDQ testing.JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS,13(1),51-55. |
| MLA | Min, YH,et al."I-DDT testing versus I-DDQ testing".JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 13.1(1998):51-55. |
入库方式： OAI收割
来源：计算技术研究所
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