Intelligent analysis and off-line debugging of VLSI device test programs
文献类型：期刊论文
| 作者 | Ma, YH; Shi, WC |
| 刊名 | JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
 |
| 出版日期 | 1999-06-01 |
| 卷号 | 14期号:3页码:273-293 |
| 关键词 | test program error type off-line debugging environment fuzzy set FCE (fuzzy comprehensive evaluation) reference set evaluation space evaluation factor evaluation remark fuzzy relation test entity relevance coefficient |
| ISSN号 | 0923-8174 |
| 英文摘要 | Today's microelectronics researchers design VLSI devices to achieve highly differentiated devices, both in performance and functionality. As VLSI devices become more complex, VLSI device testing becomes more costly and time consuming. The increasing test complexity leads to longer device test programs development time as well as more expensive test systems, and debugging test programs is a great burden to the test programs development. On the other hand, there is little formal theory of debugging, and attempts to develop a methodology of debugging are rare. The aim of the investigation in this paper is to create a theory to support analysis and debugging of VLSI device test programs, and then, on the basis of this theory, design and develop an off-line debugging environment, OLDEVDTP, for the creation, analysis, checking, identifying, error location, and correction of the device test programs off-line from the target VLSI test system, to achieve a dramatic cost and time reduction. In the paper, fuzzy comprehensive evaluation techniques are applied to the program analysis and debugging process to reduce restrictions caused by computational complexity. Analysis, design, and implementation of OLDEVDTP are also addressed in the paper. |
| WOS研究方向 | Engineering |
| 语种 | 英语 |
| WOS记录号 | WOS:000084022500008 |
| 出版者 | SPRINGER |
| 源URL | [http://119.78.100.204/handle/2XEOYT63/13300]  |
| 专题 | 中国科学院计算技术研究所期刊论文_英文 |
| 通讯作者 | Ma, YH |
| 作者单位 | 1.Advantest Amer Inc, Bethlehem, PA 18017 USA 2.Acad Sinica, Inst Comp Technol, Beijing 100080, Peoples R China |
| 推荐引用方式 GB/T 7714 | Ma, YH,Shi, WC. Intelligent analysis and off-line debugging of VLSI device test programs[J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS,1999,14(3):273-293. |
| APA | Ma, YH,&Shi, WC.(1999).Intelligent analysis and off-line debugging of VLSI device test programs.JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS,14(3),273-293. |
| MLA | Ma, YH,et al."Intelligent analysis and off-line debugging of VLSI device test programs".JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 14.3(1999):273-293. |
入库方式： OAI收割
来源：计算技术研究所
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