A loop-based apparatus for at-speed self-testing
文献类型：期刊论文
| 作者 | Li, XW; Cheung, PYS |
| 刊名 | JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY
 |
| 出版日期 | 2001-05-01 |
| 卷号 | 16期号:3页码:278-285 |
| 关键词 | built-in self-test at-speed test multiple input shift register state transition graph |
| ISSN号 | 1000-9000 |
| 英文摘要 | At-speed testing using external tester requires an expensive equip ment, thus built-in self-test (BIST) is an alternative technique due to its ability to perform on-chip at-speed self-testing. The main issue in BIST for at-speed testing is to obtain high delay fault coverage with a low hardware overhead. This paper presents an improved loop-based BIST scheme, in which a configurable MISR (multiple-input signature register) is used to generate test-pair sequences. The structure and operation modes of the BIST scheme are described. The topological properties of the state-transition-graph of the proposed BIST scheme are analyzed. Based on it, an approach to design and efficiently implement the proposed BIST scheme is developed. Experimental results on academic benchmark circuits are presented to demonstrate the effectiveness of the proposed BIST scheme as well as the design approach. |
| WOS研究方向 | Computer Science |
| 语种 | 英语 |
| WOS记录号 | WOS:000168732300008 |
| 出版者 | SCIENCE PRESS |
| 源URL | [http://119.78.100.204/handle/2XEOYT63/13435]  |
| 专题 | 中国科学院计算技术研究所期刊论文_英文 |
| 通讯作者 | Li, XW |
| 作者单位 | 1.Univ Hong Kong, Dept Elect & Elect Engn, Hong Kong, Hong Kong, Peoples R China 2.Chinese Acad Sci, Comp Technol Inst, Beijing 100080, Peoples R China |
| 推荐引用方式 GB/T 7714 | Li, XW,Cheung, PYS. A loop-based apparatus for at-speed self-testing[J]. JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY,2001,16(3):278-285. |
| APA | Li, XW,&Cheung, PYS.(2001).A loop-based apparatus for at-speed self-testing.JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY,16(3),278-285. |
| MLA | Li, XW,et al."A loop-based apparatus for at-speed self-testing".JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY 16.3(2001):278-285. |
入库方式： OAI收割
来源：计算技术研究所
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