Why RTL ATPG?
文献类型：期刊论文
| 作者 | Min, YG |
| 刊名 | JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY
 |
| 出版日期 | 2002-03-01 |
| 卷号 | 17期号:2页码:113-117 |
| 关键词 | automatic test generation (ATPG) register transfer level (RTL) |
| ISSN号 | 1000-9000 |
| 英文摘要 | Register Transfer Level (RTL) Automatic Test Pattern Generation (ATPG) has been of wide concern for two decades. Meanwhile gate-level ATPG has made remarkable progress in dealing with large circuits. An argument is then posed. Do we need RTL ATPG in the case of gate-level ATPG capable of generating tests for large circuits? This paper attempts to answer this question. The necessity, difficulty, and major interests of RTL ATPG are reviewed. |
| WOS研究方向 | Computer Science |
| 语种 | 英语 |
| WOS记录号 | WOS:000174736600001 |
| 出版者 | SCIENCE PRESS |
| 源URL | [http://119.78.100.204/handle/2XEOYT63/13568]  |
| 专题 | 中国科学院计算技术研究所期刊论文_英文 |
| 通讯作者 | Min, YG |
| 作者单位 | Chinese Acad Sci, Comp Technol Inst, Beijing 100080, Peoples R China |
| 推荐引用方式 GB/T 7714 | Min, YG. Why RTL ATPG?[J]. JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY,2002,17(2):113-117. |
| APA | Min, YG.(2002).Why RTL ATPG?.JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY,17(2),113-117. |
| MLA | Min, YG."Why RTL ATPG?".JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY 17.2(2002):113-117. |
入库方式： OAI收割
来源：计算技术研究所
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