I-DDT: Fundamentals and test generation
文献类型：期刊论文
| 作者 | Kuang, JS; You, ZQ; Zhu, QJ; Min, YH |
| 刊名 | JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY
 |
| 出版日期 | 2003-05-01 |
| 卷号 | 18期号:3页码:299-307 |
| 关键词 | I-DDT testing logical transition hazard stuck-open fault |
| ISSN号 | 1000-9000 |
| 英文摘要 | It is the time to explore the fundamentals Of I-DDT testing when extensive work has been done for I-DDT testing since it was proposed; This paper precisely defines the concept of average transient current (I-DDT) of CMOS digital ICs, and experimentally analyzes the feasibility Of I-DDT test generation at gate level. Based on the SPICE simulation results, the paper suggests a formula to calculate I-DDT by means of counting only logical up-transitions, which enables I-DDT test generation at logic level. The Bayesian optimization algorithm is utilized for I-DDT test generation. Experimental results show that about 25% stuck-open faults are with I-DDT testability larger than 2.5, and likely to be I-DDT testable. It is also found that Most I-DDT testable faults are located near the primary inputs of a circuit under test. I-DDT test generation does not require fault sensitization procedure compared with stuck-at fault test generation. Furthermore, some redundant stuck-at faults can be detected by using I-DDT testing. |
| WOS研究方向 | Computer Science |
| 语种 | 英语 |
| WOS记录号 | WOS:000183210500004 |
| 出版者 | SCIENCE CHINA PRESS |
| 源URL | [http://119.78.100.204/handle/2XEOYT63/13727]  |
| 专题 | 中国科学院计算技术研究所期刊论文_英文 |
| 通讯作者 | Kuang, JS |
| 作者单位 | 1.Hunan Univ, Coll Comp & Commun, Changsha 410082, Peoples R China 2.Chinese Acad Sci, Inst Comp Technol, Beijing 100080, Peoples R China |
| 推荐引用方式 GB/T 7714 | Kuang, JS,You, ZQ,Zhu, QJ,et al. I-DDT: Fundamentals and test generation[J]. JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY,2003,18(3):299-307. |
| APA | Kuang, JS,You, ZQ,Zhu, QJ,&Min, YH.(2003).I-DDT: Fundamentals and test generation.JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY,18(3),299-307. |
| MLA | Kuang, JS,et al."I-DDT: Fundamentals and test generation".JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY 18.3(2003):299-307. |
入库方式： OAI收割
来源：计算技术研究所
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