Atomic Force Microscopy with Nanoscale Cantilevers Resolves Different Structural Conformations of the DNA Double Helix
文献类型：期刊论文
| 作者 | Leung, C ; Bestembayeva, A ; Thorogate, R ; Stinson, J ; Pyne, A ; Marcovich, C ; Yang, JL ; Drechsler, U ; Despont, M ; Jankowski, T ; Tschope, M ; Hoogenboom, BW |
| 刊名 | nano letters
 |
| 出版日期 | 2012 |
| 卷号 | 12期号:7页码:3846-3850 |
| 学科主题 | 光电子学 |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2013-03-17 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/23603]  |
| 专题 | 半导体研究所_半导体集成技术工程研究中心 |
| 推荐引用方式 GB/T 7714 | Leung, C,Bestembayeva, A,Thorogate, R,et al. Atomic Force Microscopy with Nanoscale Cantilevers Resolves Different Structural Conformations of the DNA Double Helix[J]. nano letters,2012,12(7):3846-3850. |
| APA | Leung, C.,Bestembayeva, A.,Thorogate, R.,Stinson, J.,Pyne, A.,...&Hoogenboom, BW.(2012).Atomic Force Microscopy with Nanoscale Cantilevers Resolves Different Structural Conformations of the DNA Double Helix.nano letters,12(7),3846-3850. |
| MLA | Leung, C,et al."Atomic Force Microscopy with Nanoscale Cantilevers Resolves Different Structural Conformations of the DNA Double Helix".nano letters 12.7(2012):3846-3850. |
入库方式： OAI收割
来源：半导体研究所
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