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A sub-pixel extraction method for the center of the circular structure from spot array calibration target (EI CONFERENCE)

文献类型：会议论文

作者Liu Y.; Zhang T.; Yang H.; Gao X.; Liu Y.; Liu Y.
出版日期2012
会议名称2012 3rd International Conference on Information Technology for Manufacturing Systems, ITMS 2012, September 8, 2012 - September 9, 2012
会议地点Qingdao, China
关键词The imaging measurement system must be calibrated before application. In calibration procedure sub-pixel center extraction is the crucial step for the final accuracy. In this paper a new sub-pixel extraction method is proposed. Edge detection at pixel level is obtained using LOG operator then sub-pixel edge detection is realized using the Facet model. Finally the least squares ellipse fitting is operated on the sub-pixel edge to determine the sub-pixel center. Experiment on a series of simulated images indicates that this algorithm is able to realize the center location accuracy of 0.01-0.02 pixel and meets the requirement of sub-pixel level. (2012) Trans Tech Publications Switzerland.
页码1090-1094
收录类别EI
源URL[http://ir.ciomp.ac.cn/handle/181722/32959]  
专题长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式
GB/T 7714		 Liu Y.,Zhang T.,Yang H.,et al. A sub-pixel extraction method for the center of the circular structure from spot array calibration target (EI CONFERENCE)[C]. 见:2012 3rd International Conference on Information Technology for Manufacturing Systems, ITMS 2012, September 8, 2012 - September 9, 2012. Qingdao, China.

入库方式： OAI收割

来源：长春光学精密机械与物理研究所

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