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The research on distortion measurement and compensation technology in photoelectricity measurement system (EI CONFERENCE)

文献类型：会议论文

作者Hong F. ; Mujun X. ; Zhiqian W.
出版日期2010
会议名称2010 International Conference on Computer, Mechatronics, Control and Electronic Engineering, CMCE 2010, August 24, 2010 - August 26, 2010
会议地点Changchun, China
关键词The distortion made by optical lens largely affect the measurement accuracy of the large field of view photoelectricity measurement system according to the theory of aberration in the photoelectricity system this paper design a series of distortion measurement devices in connection with the process of distortion correction in photoelectricity system establish the related mathmatics model make the real time distortion correction by the method of software compensation. The experimental results demonstrate the method decrease the measurement error made by the photoelectricity system distortion after the compensation in tatal field of view the systematic measurement error is less than 0.5 picture element. 2010 IEEE.
页码383-388
收录类别EI
源URL[http://ir.ciomp.ac.cn/handle/181722/33320]  
专题长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式
GB/T 7714		 Hong F.,Mujun X.,Zhiqian W.. The research on distortion measurement and compensation technology in photoelectricity measurement system (EI CONFERENCE)[C]. 见:2010 International Conference on Computer, Mechatronics, Control and Electronic Engineering, CMCE 2010, August 24, 2010 - August 26, 2010. Changchun, China.

入库方式： OAI收割

来源：长春光学精密机械与物理研究所

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