CCD performance model and noise control (EI CONFERENCE)
文献类型：会议论文
| 作者 | Sun H.; Wang Z.; Wang Z.; Sun H. |
| 出版日期 | 2011 |
| 会议名称 | 3rd International Conference on Image Analysis and Signal Processing, IASP 2011, October 21, 2011 - October 23, 2011 |
| 会议地点 | Wuhan, China |
| 关键词 | In this paper we describe the performance models of a Charge Coupling Device (CCD) and discuss the issues in the CCD image sensor that deteriorates the CCD imaging performance. We analyze the cause of noise in the CCD imaging sensor and provide methods to control the CCD noise to improve the CCD's imaging quality. Some simulation results are presented in the paper to show the efficiency of the noise control methods. 2011 IEEE. |
| 页码 | 389-394 |
| 收录类别 | EI |
| 源URL | [http://ir.ciomp.ac.cn/handle/181722/33328]  |
| 专题 | 长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文 |
| 推荐引用方式 GB/T 7714 | Sun H.,Wang Z.,Wang Z.,et al. CCD performance model and noise control (EI CONFERENCE)[C]. 见:3rd International Conference on Image Analysis and Signal Processing, IASP 2011, October 21, 2011 - October 23, 2011. Wuhan, China. |
入库方式： OAI收割
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