中国科学院机构知识库网格系统: Noise processing technology of a TDICCD sensor (EI CONFERENCE)

中国科学院机构知识库网格

Chinese Academy of Sciences Institutional Repositories Grid

Noise processing technology of a TDICCD sensor (EI CONFERENCE)

文献类型：会议论文


作者	Zhang L.-P.
出版日期	2010
会议名称	2010 International Conference on Computer, Mechatronics, Control and Electronic Engineering, CMCE 2010, August 24, 2010 - August 26, 2010
会议地点	Changchun, China
关键词	In the application of TDI-CCD the other is all kinds of interference noise produced in the working process of a TDI-CCD for reset noise because of its serious noise interference such as reset noise and 1 / f noise correlated double sampling is employed. The experimental results show that after noise processing the imaging quality is reduced etc. According to the features of noise the output S/N has been raised to about 50 dB. 2010 IEEE. so that it is necessary to study the noise characteristics of TDI-CCD. There are two categories of noise this paper has studied the corresponding noise-processing technology. For dark current noise one is the inherent noise refrigeration is taken including shot noise dark current noise fixed pattern noise and transfer noise etc.
页码	395-398
收录类别	EI
源URL	[http://ir.ciomp.ac.cn/handle/181722/33335]
专题	长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式 GB/T 7714	Zhang L.-P.. Noise processing technology of a TDICCD sensor (EI CONFERENCE)[C]. 见:2010 International Conference on Computer, Mechatronics, Control and Electronic Engineering, CMCE 2010, August 24, 2010 - August 26, 2010. Changchun, China.

入库方式： OAI收割

来源：长春光学精密机械与物理研究所

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