中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
首页 机构 成果 学者
  
  1. CAS IR Grid
  2. 长春光学精密机械与物理研究所
  3. 中国科学院长春光学精密机械与物理研究所
  4. 中科院长春光机所知识产出
  5. 会议论文
A new high-precision measurement system used in the image calibration of large-sized photographic instrument (EI CONFERENCE)

文献类型：会议论文

作者Li Y.; Liu Z.; Li Y.; Li Y.; Li Y.
出版日期2005
会议名称Optical Design and Testing II, November 8, 2004 - November 11, 2004
会议地点Beijing, United states
关键词The purpose of characterizing the image of large-sized photographic instrument is to make the directionality of three coordinate axises in the three-dimensional coordinate of the image and the directionality of three axises of coordinate in the frame of axes of the instrument keep the same direction. This problem was solved by a high-precision measurement system composed of double-theodolite and a set of communication system. Two cube prisms will be respectively placed on the image surface and the instrument. Every cube prism will stand for a three-dimensional coordinate from the image surface or the instrument. As a result the interdependence of both coordinates from the image surface and the instrument can be obtained by measuring the interdependence of the both cube prisms with autocollimation survey axiom. In the survey system two high-precision stations TDA5005 from Leica Company will be selected as double-theodolite and the interdependence of both coordinates can be achieved by moving the station only at one time. Therefore this measurement system is a high efficient and high-precision surveying method to the image calibration of the large-sized photographic instrument. Based on the experiment its measuring accuracy can reach arc-second level.
页码404-411
收录类别EI
源URL[http://ir.ciomp.ac.cn/handle/181722/33346]  
专题长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式
GB/T 7714		 Li Y.,Liu Z.,Li Y.,et al. A new high-precision measurement system used in the image calibration of large-sized photographic instrument (EI CONFERENCE)[C]. 见:Optical Design and Testing II, November 8, 2004 - November 11, 2004. Beijing, United states.

入库方式： OAI收割

来源：长春光学精密机械与物理研究所

浏览0
下载0
收藏0
其他版本

除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。