中国科学院机构知识库网格系统: The research on the automatic measurement of frequency characteristics of opto-electronic platform (EI CONFERENCE)

中国科学院机构知识库网格

Chinese Academy of Sciences Institutional Repositories Grid

The research on the automatic measurement of frequency characteristics of opto-electronic platform (EI CONFERENCE)

文献类型：会议论文


作者	Liu H.; Liu H.; Chen J.; Liu H.
出版日期	2010
会议名称	2010 International Conference on Computer, Mechatronics, Control and Electronic Engineering, CMCE 2010, August 24, 2010 - August 26, 2010
会议地点	Changchun, China
关键词	A new frequency characteristic test method is proposed based on the digitization characteristics of optoelectronic platform servo system. First a digital processing controller is used to automatically test the entire process and tested data are uploaded to a PC through CAN-bus and then the tested data are transferred into accurate transfer function with the Levy method. Here we discuss the testing steps the data processing the extraction the Bode diagram plotting and the model identification in detail. The corresponding experiments are carried out and the results show that the method is simple with the features of high efficiency high precision and engineering feasibility. 2010 IEEE.
页码	421-424
收录类别	EI
源URL	[http://ir.ciomp.ac.cn/handle/181722/33364]
专题	长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式 GB/T 7714	Liu H.,Liu H.,Chen J.,et al. The research on the automatic measurement of frequency characteristics of opto-electronic platform (EI CONFERENCE)[C]. 见:2010 International Conference on Computer, Mechatronics, Control and Electronic Engineering, CMCE 2010, August 24, 2010 - August 26, 2010. Changchun, China.

入库方式： OAI收割

来源：长春光学精密机械与物理研究所

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