中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Research on the nonuniformity correction of linear TDI CCD remote camera (EI CONFERENCE)

文献类型:会议论文

作者Ya-xia L. ; Zhi-hang H.
出版日期2005
会议名称Advanced Materials and Devices for Sensing and Imaging II, November 8, 2004 - November 10, 2004
会议地点Beijing, China
关键词Many applications such as industrial inspection and overhead reconnaissance benefit from line scanning architectures where time delay integration (TDI) significantly improves sensitivity[5]. Images with linear response have become the backbone of the imaging industry. But each pixel of the TDI CCD has unique light sensitivity characteristics. Because these characteristics and the lens of the optical system affect camera's linearization and its performance they must be removed through calibration. The process by which a CCD image is calibrated is known as nonuniformity correction. This paper discusses several methods of nonuniformity correction[2]. The first is one-point correction technique which requires only one calibration point. This approach is to shift each curve toward the nominal curve by subtracting the offset from or adding the offset to the average. The second is two-point correction technique which requires two calibration points. Each point is rotated and aligned so that all the detectors have the same response under the same radiance. The third is multipoint correction. It is recommended that more calibration points be implemented at appropriate regions of the response curve. Depend on the linear photoelectric response of the TDI CCD we use two-point calibration and the standard deviations for the images are given before and after the correction.
页码527-535
收录类别EI
源URL[http://ir.ciomp.ac.cn/handle/181722/33434]  
专题长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
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Ya-xia L.,Zhi-hang H.. Research on the nonuniformity correction of linear TDI CCD remote camera (EI CONFERENCE)[C]. 见:Advanced Materials and Devices for Sensing and Imaging II, November 8, 2004 - November 10, 2004. Beijing, China.

入库方式: OAI收割

来源:长春光学精密机械与物理研究所

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