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Directional multiscale edge detection using the contourlet transform (EI CONFERENCE)

文献类型：会议论文

作者Jin L.-X.; Han S.-L.; Zhang R.-F.
出版日期2010
会议名称2010 IEEE International Conference on Advanced Computer Control, ICACC 2010, March 27, 2010 - March 29, 2010
会议地点445 Hoes Lane - P.O.Box 1331, Piscataway, NJ 08855-1331, United States
关键词Wavelet multiresolution analysis allows us to detect edges at different scales also to obtain other important aspects of the extracted edges. However due to the usual two-dimensional tensor product wavelet transform is not optimal for representing images. The main problem in edge detection using wavelet transform is that it can only capture point-singularities and the extracted edges are not continuous. In order to solve that problem we propose a new image edge detection method based on the contourlet transform. The directional multiresolution representation Contourlet takes advantages of the intrinsic geometrical structure of images and is appropriate for the analysis of the image edges. Using the modulus maxima detection an image edge detection method based on contourlet transform is proposed. To suppress the image noise effect on edge detection the scale multiplication in contourlet domain is also proposed. Through real images experiments the proposed edge detection method's performance for the extracted edges is analyzed and compared with other two edge detection methods. The experiment result proves that the proposed edge detection method improves over wavelet-based techniques and Canny detector and also works well for noisy images. 2010 IEEE.
页码58-62
收录类别EI
源URL[http://ir.ciomp.ac.cn/handle/181722/33471]  
专题长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式
GB/T 7714		 Jin L.-X.,Han S.-L.,Zhang R.-F.. Directional multiscale edge detection using the contourlet transform (EI CONFERENCE)[C]. 见:2010 IEEE International Conference on Advanced Computer Control, ICACC 2010, March 27, 2010 - March 29, 2010. 445 Hoes Lane - P.O.Box 1331, Piscataway, NJ 08855-1331, United States.

入库方式： OAI收割

来源：长春光学精密机械与物理研究所

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