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Comparison of radiation temperature measurement precision between middlewave and longwave thermal-imaging systems (EI CONFERENCE)

文献类型：会议论文

作者Sun Z.
出版日期2012
会议名称2012 International Conference on Optoelectronics and Microelectronics, ICOM 2012, August 23, 2012 - August 25, 2012
会议地点Changchun, China
关键词A comparison study on temperature measurement precision between middlewave 3-5m and longwave 8-12m measuring thermal imaging systems has been conducted. The study was limited to systems working in indoor conditions and the target's temperature is in the range of 270K900K. First the Disturb Resisting Function (DRF) of infrared systems is deduced. On the base of DRF curve we find that the middlewave infrared system get the smaller influences under the same size disturb compared with the longwave system. A theory of the influence of target's physical characteristic and measurement conditions on the accuracy of temperature measurements has been developed. On the basis of the developed formulas an analysis of the influence of signal disturbances (because of incorrectly assumed emissivity limited transmittance of the atmosphere radiation reflected by the object and shift of optics radiation) on the accuracy of temperature measurement has been made. It has been found that the middlewave systems in typical temperature range offer generally better accuracy in temperature measurement than the longwave ones do. 2012 IEEE.
页码591-596
收录类别EI
源URL[http://ir.ciomp.ac.cn/handle/181722/33475]  
专题长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式
GB/T 7714		 Sun Z.. Comparison of radiation temperature measurement precision between middlewave and longwave thermal-imaging systems (EI CONFERENCE)[C]. 见:2012 International Conference on Optoelectronics and Microelectronics, ICOM 2012, August 23, 2012 - August 25, 2012. Changchun, China.

入库方式： OAI收割

来源：长春光学精密机械与物理研究所

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