中国科学院机构知识库网格系统: Simulation test system of CCD signal processor based on FPGA (EI CONFERENCE)

中国科学院机构知识库网格

Chinese Academy of Sciences Institutional Repositories Grid

Simulation test system of CCD signal processor based on FPGA (EI CONFERENCE)

文献类型：会议论文


作者	Zhang D.; Liu D.-B.; Zhang D.
出版日期	2013
会议名称	2nd International Conference on Mechatronics and Applied Mechanics, ICMAM 2012, December 8, 2012 - December 9, 2012
会议地点	Taiwan
关键词	Simulation test system of CCD signal processor based on FPGA is proposed. Field-programmable gate array (FPGA) is applied as control processing core and used in the aerospace upgrade screening of industrial grade signal processor. The system functional composition and working principle were introduced in detail. Actually evaluation and testing system was completed with integrating the forty signal processor in a single board. The system has been successfully applied in the dynamic build-in screening test of industrial grade signal processor XRD98L63 the system work stably and reliability. Test result is zero on the nonconforming product rate satisfying the qualification that single batch screening nonconforming rate is less than 5% build-in screening of industrial grade components for the space load applications is implemented. (2013) Trans Tech Publications Switzerland.
页码	698-702
收录类别	EI
源URL	[http://ir.ciomp.ac.cn/handle/181722/33514]
专题	长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式 GB/T 7714	Zhang D.,Liu D.-B.,Zhang D.. Simulation test system of CCD signal processor based on FPGA (EI CONFERENCE)[C]. 见:2nd International Conference on Mechatronics and Applied Mechanics, ICMAM 2012, December 8, 2012 - December 9, 2012. Taiwan.

入库方式： OAI收割

来源：长春光学精密机械与物理研究所

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