中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
A new algorithm of image segmentation for overlapping grain image (EI CONFERENCE)

文献类型:会议论文

作者Zhang X.; Zhang X.; Zhang X.
出版日期2006
会议名称ICO20: Optical Information Processing, August 21, 2005 - August 26, 2005
会议地点Changchun, China
关键词Image segmentation is primary issue in image processing at the same time it is principal problem in low level vision in computer vision field. It is the key technology to process image analysis image comprehend and image depict successfully. Aim at measurement of granularity size of nonmetal grain a new algorithm of image segmentation and parameters calculation for overlapping grain image is studied. The hypostasis of this algorithm is present some new attributes of graph sequence from discrete attribute of graph consequently achieve that pick up the geometrical characteristics from input graph and new graph sequence which in favor of image segmentation is recombined. The conception that image edge denoted with "twin-point" is put forward base on geometrical characters of point image edge is transformed into serial edge and on recombined serial image edge based on direction vector definition of line and some additional restricted conditions the segmentation twin-points are searched with thus image segmentation is accomplished. Serial image edge is transformed into twin-point pattern to realize calculation of area and granularity size of nonmetal grain. The inkling and uncertainty on selection of structure element which base on mathematical morphology are avoided in this algorithm and image segmentation and parameters calculation are realized without changing grain's self statistical characters.
收录类别EI
源URL[http://ir.ciomp.ac.cn/handle/181722/33650]  
专题长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式
GB/T 7714
Zhang X.,Zhang X.,Zhang X.. A new algorithm of image segmentation for overlapping grain image (EI CONFERENCE)[C]. 见:ICO20: Optical Information Processing, August 21, 2005 - August 26, 2005. Changchun, China.

入库方式: OAI收割

来源:长春光学精密机械与物理研究所

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