中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
A new segmentation method of CR images based on discrete wavelet transform and mathematics morphology (EI CONFERENCE)

文献类型:会议论文

作者Li Z.; Li Z.
出版日期2006
会议名称ICO20: Optical Information Processing, August 21, 2005 - August 26, 2005
会议地点Changchun, China
关键词In this paper we propose a segmentation method of CR(computed radiography) images with being rid of under-segmentation and over-segmentation. An under-segmentation occurs when pixels belonging to different objects are grouped into a single region. Such errors are the most dangerous because they can invalidate the whole segmentation process. The phenomenon always takes place when we segment CR images because of the principle of CR. In order to depressed under-segmentation we enhance the CR images using DWT (discrete wavelet transform) to get more detail of CR image features. As we enhance the CR image the over-segmentation maybe occurs. Compared with under-segmentation the over-segmentation occurs when a single objects is subdivided by segmentation into several region. For the purpose of preventing from the over-segmentation we present a scheme for enhanced CR images based on watershed algorithm that solves over-segmentation problem. We use marker-based watershed algorithm. Together with gradient image and marker image watershed segmentation can make sure to partition CR image into meaningful object and avoid further segmentation of homogeneous regions. The result of the proposed algorithm are compared with those of other standard methods. Experiments have shown a better result and indeed solved under-segmentation and over-segmentation problems.
收录类别EI
源URL[http://ir.ciomp.ac.cn/handle/181722/33653]  
专题长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式
GB/T 7714
Li Z.,Li Z.. A new segmentation method of CR images based on discrete wavelet transform and mathematics morphology (EI CONFERENCE)[C]. 见:ICO20: Optical Information Processing, August 21, 2005 - August 26, 2005. Changchun, China.

入库方式: OAI收割

来源:长春光学精密机械与物理研究所

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