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CAS IR Grid
长春光学精密机械与物理研究所
中国科学院长春光学精密机械与物理研究所
中科院长春光机所知识产出
会议论文
Study of removing striping noise in CCD image (EI CONFERENCE)
文献类型:会议论文
作者
Liu H.
;
Liu H.
;
Liu H.
出版日期
2006
会议名称
ICO20: Optical Information Processing, August 21, 2005 - August 26, 2005
会议地点
Changchun, China
关键词
Striping noise is the common system noise during formation of image using linear array CCD and has the character of periodicity
directivity and banding distributing. It can be caused by errors in internal calibration devices
or by slight gain/offset differences among the elements that conform the array of detectors. Striping noise covers up useful information in CCD image and brings adverse effect to image interpretation. On the basis of analyzing wavelet decomposed coefficient
the regularities of distribution about striping noise in wavelet coefficient is found
thereby the method of wavelet threshold selection which is suitable to striping noise distribution is put forward. According to Donoho's method about denoising using wavelet
the image including striping noise is processed. Comparing the power spectrum of processed image with the one of original image polluted by striping noise in frequency field
we find pulse brought by striping noise is removed and the goal which reserves image details and reduces stripes is achieved.
收录类别
EI
源URL
[
http://ir.ciomp.ac.cn/handle/181722/33671
]
专题
长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式
GB/T 7714
Liu H.,Liu H.,Liu H.. Study of removing striping noise in CCD image (EI CONFERENCE)[C]. 见:ICO20: Optical Information Processing, August 21, 2005 - August 26, 2005. Changchun, China.
入库方式:
OAI收割
来源:
长春光学精密机械与物理研究所
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