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Rigorous vector analysis of diffractive microlens by using of finitedifference time-domain method (EI CONFERENCE)

文献类型：会议论文

作者Liu Y.; Liu H.; Liu H.; Liu H.; Liu Y.; Liu Y.
出版日期2009
会议名称2009 International Conference on Optical Instruments and Technology, OIT 2009, October 19, 2009 - October 22, 2009
会议地点Shanghai, China
关键词We use finite difference time domain (FDFD) method as rigorous vector analysis model to simulate the focusing process of diffractive microlens (DML). Differing with most analysis model which the near field distributions are calculated by FDTD and then far field are obtained by using of propagation method we obtain the fields in whole computational space by using of FDTD only. The advantages are that all the results are vector based and the computational time is saved greatly. In this paper we present two methods to obtain wave amplitude one is comparison method and the other is integral method. Depending on wave amplitude in the whole computational space one can conveniently obtain distributions of electric field intensity and calculate the time-average Poynting vector. We also present the formulation for calculating diffractive efficiency of DML based on time-average Poynting vector which denotes energy flow. As demonstration a DML is analyzed by using of these algorithms. The time depended graphic results of FDTD show the process of wave propagation. The distribution of electric field intensity illustrates the focusing of the normal incident light. The focus pattern in the focal plane is also show. The diffractive efficiency of the DML is calculated by using of the energy flow method in this paper. The results show the high accuracy and efficiency of the model. 2009 SPIE.
收录类别EI
源URL[http://ir.ciomp.ac.cn/handle/181722/33697]  
专题长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式
GB/T 7714		 Liu Y.,Liu H.,Liu H.,et al. Rigorous vector analysis of diffractive microlens by using of finitedifference time-domain method (EI CONFERENCE)[C]. 见:2009 International Conference on Optical Instruments and Technology, OIT 2009, October 19, 2009 - October 22, 2009. Shanghai, China.

入库方式： OAI收割

来源：长春光学精密机械与物理研究所

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