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Geometrical modulation transfer function of different active pixel of CMOS APS (EI CONFERENCE)

文献类型：会议论文

作者Li J.; Liu J.; Liu J.; Liu J.; Li J.; Li J.
出版日期2006
会议名称2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 2, 2005 - November 5, 2005
会议地点Zian, China
关键词The geometrical Modulation Transfer Function (MTF) of CMOS APS (active pixel sensor) is analyzed in this paper. Advanced APS have been designed and fabricated where different pixel shapes such as square rectangle and L shape were placed because the amplifier circuit and other function circuits inter pixel of APS take up some pixel area. MTF is an important figure of merit in focal plane array imaging sensors. Research on analyzing the MTF for the proper pixel shape is currently in progress for a centroidal configuration of a target position. MTF will give us a more complete understanding of the tradeoffs opposed by the different pixel designs and by the signal processing conditions. Based on image sensor sampling and reconstructing model the MTF expression of any active pixel shape has been deduced in this paper. According to actual pixel shape three different active area pixels were analyzed they were square rectangle and L shape their Fill Factor (FF) is 30% 44% and 55% respectively. Results of simulation experiments indicate that different pixel geometrical characteristics contribute significantly to the figures of their MTF. Different geometrical shape of active sensitive area of pixel and different station in pixel would influence MTF figures. The analysis results are important in designing better APS pixel and more important in analyzing imaging system performance of APS subpixel precision system.
收录类别EI
源URL[http://ir.ciomp.ac.cn/handle/181722/33717]  
专题长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式
GB/T 7714		 Li J.,Liu J.,Liu J.,et al. Geometrical modulation transfer function of different active pixel of CMOS APS (EI CONFERENCE)[C]. 见:2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 2, 2005 - November 5, 2005. Zian, China.

入库方式： OAI收割

来源：长春光学精密机械与物理研究所

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