中国科学院机构知识库网格系统: Non-contact and on-line cone diameter measuring based on high speed linear CCD (EI CONFERENCE)

中国科学院机构知识库网格

Chinese Academy of Sciences Institutional Repositories Grid

Non-contact and on-line cone diameter measuring based on high speed linear CCD (EI CONFERENCE)

文献类型：会议论文


作者	Guohui Z. ; Jianhua W.
出版日期	2006
会议名称	2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 2, 2005 - November 5, 2005
会议地点	Zian, China
关键词	The remarkable improvement of sensing and processing hardware performance makes the non-contact on-line high accuracy and high speed measuring possible by means of linear CCD. The goal of this pager is to describe the key questions on designing the cone diameter detecting system by linear CCD. This paper first describes the detecting scheme. In particular the factors affecting accuracy such as resolution voltage difference between neighbor pixels detecting rate and so on are analyzed and the quantitative estimation equations are provided. CCD takes on the photoelectric translation and measuring component double functions so the waveform of CCD output signal and the affecting factors merit deep discussion. On the basis of discussion several principles that can be used to improve the boundary recognition accuracy are presented.
收录类别	EI
源URL	[http://ir.ciomp.ac.cn/handle/181722/33719]
专题	长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式 GB/T 7714	Guohui Z.,Jianhua W.. Non-contact and on-line cone diameter measuring based on high speed linear CCD (EI CONFERENCE)[C]. 见:2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 2, 2005 - November 5, 2005. Zian, China.

入库方式： OAI收割

来源：长春光学精密机械与物理研究所

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