中国科学院机构知识库网格系统: Research of automatic test technology of parameters used in a dual-CCD TV measure-system (EI CONFERENCE)

中国科学院机构知识库网格

Chinese Academy of Sciences Institutional Repositories Grid

Research of automatic test technology of parameters used in a dual-CCD TV measure-system (EI CONFERENCE)

文献类型：会议论文


作者	Wang L.; Li Y.; Li Y.; Li Y.; Li Y.; Wang L.; Wang L.; Zhao J.
出版日期	2006
会议名称	2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 2, 2005 - November 5, 2005
会议地点	Zian, China
关键词	This paper describes a kind of automatic test technology of the parameters used in a dual-CCD TV measure-system (TV -MS) .The TV -MS is the ground control equipment of the anti-tank missile and integrates the technologies of optical machine and electronics. It is important and key component. The main technical parameters of the TV -MS are field of view zero point precision sensitivity anti-jamming ability zooming time and focus time etc. To insure the TV -MS satisfying the tactical and technical requirements and discover fault and reason a fast and accurate equipment satisfying the test technical parameters of the TV -MS is urgently needed in manufacture and service. Firstly the parameter test system converted optical signal to electronic signal implemented automatic control of the invariant illumination of parallel pipeline output. Secondly data and command delivering displaying or printing are realized by using 80C196KB. The experiment result shows that the approach of automatic testing of the Parameters used in a dual-CCD TV -MS is successful and it can be used for all tests of the functions and parameters of the TV -MS. The main innovations are to realize the fast veracious measure of technical parameters of the dual-CCD TV-MS and integrate the technologies of optics machineries and electronics. An advanced means is provided to judge the technical states find malfunctions and discover the reasons in producing and maintaining process. The equipment suited for anti-tank missile systems is given.
收录类别	EI
源URL	[http://ir.ciomp.ac.cn/handle/181722/33720]
专题	长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式 GB/T 7714	Wang L.,Li Y.,Li Y.,et al. Research of automatic test technology of parameters used in a dual-CCD TV measure-system (EI CONFERENCE)[C]. 见:2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 2, 2005 - November 5, 2005. Zian, China.

入库方式： OAI收割

来源：长春光学精密机械与物理研究所

浏览0

下载0

收藏0

其他版本

除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。