中国科学院机构知识库网格系统: Mid-frequency surface error test with a Foucault apparatus (EI CONFERENCE)

中国科学院机构知识库网格

Chinese Academy of Sciences Institutional Repositories Grid

Mid-frequency surface error test with a Foucault apparatus (EI CONFERENCE)

文献类型：会议论文


作者	Li J.; Li J.; Xuan B.; Li J.
出版日期	2007
会议名称	3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, July 8, 2007 - July 12, 2007
会议地点	Chengdu, China
关键词	Testing of mid-frequency surface error is of the first importance for fast optics especially for large aperture aspherics. Foucault test plays a dominant role for surface error inspection before the digital interferometer age but it seems to have faded out these days because no quantitative results turn out. However an interferometer with high resolution CCDs is either unavailable or unaccessible in the process of manufacture. As its advantages are realized and recognized for the second time Foucault test is going back to the stage again. A new theory of calculating the contrast of the shadow pattern of Foucault test is put forward in this paper and some modifications are discussed upon the analyses of the limitation of traditional Foucault apparatus. A paraboloidal mirror was fabricated and tested by the modified Foucault apparatus whose effect has been proved to be great. The methods of controlling mid-frequency error are described in the other paper at this conference- "Multi-mode combine manufacturing technology for large aperture aspheric mirrors"1.
收录类别	EI
源URL	[http://ir.ciomp.ac.cn/handle/181722/33756]
专题	长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式 GB/T 7714	Li J.,Li J.,Xuan B.,et al. Mid-frequency surface error test with a Foucault apparatus (EI CONFERENCE)[C]. 见:3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, July 8, 2007 - July 12, 2007. Chengdu, China.

入库方式： OAI收割

来源：长春光学精密机械与物理研究所

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