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High accuracy star image locating and imaging calibration for star sensor technology (EI CONFERENCE)

文献类型：会议论文

作者Wang Y.; Wang Y.; Wang Y.; Wang Y.; Wang Y.; Sun H.; Sun H.; Zhang S.
出版日期2010
会议名称6th International Symposium on Precision Engineering Measurements and Instrumentation, August 8, 2010 - August 11, 2010
会议地点Hangzhou, China
关键词Today aircraft attitude measurement technology plays an important role in an aircraft system because it can provide orientation for aircraft in action. Lately star sensor technology used in aircraft attitude measurement has become more and more popular because of its high accuracy light weight without attitude accumulation errors and other advantages. There are three main steps for star sensor to measure aircraft attitude star image locating star identification and attitude tracking. The latter two steps are based on the accuracy of star image locating. So it's critical to make efforts to advance the accuracy of star image locating. Some imaging errors such as spherical aberration or coma aberration also have negative effect on the accuracy of star image locating of which the effect is necessarily reduced as well. At the beginning of this article the structure of star sensor hardware is introduced. Secondly three methods for star image locating are described specifically which are traditional centroid method Gauss quadric fitting method and improved Gauss quadric fitting method. Subsequently an imaging calibration method is described for the purpose of reducing the effect of imaging errors. Finally the experiment shows that the accuracy of the star sensor is 2-arc-second. 2010 SPIE.
收录类别EI
源URL[http://ir.ciomp.ac.cn/handle/181722/33788]  
专题长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式
GB/T 7714		 Wang Y.,Wang Y.,Wang Y.,et al. High accuracy star image locating and imaging calibration for star sensor technology (EI CONFERENCE)[C]. 见:6th International Symposium on Precision Engineering Measurements and Instrumentation, August 8, 2010 - August 11, 2010. Hangzhou, China.

入库方式： OAI收割

来源：长春光学精密机械与物理研究所

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