中国科学院机构知识库网格系统: Analysis of a precise instrument for measuring reference level involute (EI CONFERENCE)

中国科学院机构知识库网格

Chinese Academy of Sciences Institutional Repositories Grid

Analysis of a precise instrument for measuring reference level involute (EI CONFERENCE)

文献类型：会议论文


作者	Zhang Y.; Wang X.; Wang X.; Wang X.; Wang L.; Wang L.; Wang L.
出版日期	2006
会议名称	Third International Symposium on Precision Mechanical Measurements, August 2, 2006 - August 6, 2006
会议地点	Xinjiang, China
关键词	Reference level involute is used for evaluating other involutes but it is very difficult to measure reference level involute exactly. Nowadays the available methods for measuring precise involute include single base disc mode electronic generation mode and CNC three-coordinate mode. But measurement accuracy of the modes above is not suitable for reference level involute. A precise instrument for measuring reference level involute double base discs instrument is introduced. It is consistent with generation principle of the involute entirely. Besides having the advantages of single basic disc instrument the instrument can remove Abbe error caused by the stylus and has no pressure deforming. The instrument's structure is described. The main sources of measurement errors are analyzed and methods for compensation are presented. Finally uncertainty of the instrument is given which meets reference level involute test specification.
收录类别	EI
源URL	[http://ir.ciomp.ac.cn/handle/181722/33794]
专题	长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式 GB/T 7714	Zhang Y.,Wang X.,Wang X.,et al. Analysis of a precise instrument for measuring reference level involute (EI CONFERENCE)[C]. 见:Third International Symposium on Precision Mechanical Measurements, August 2, 2006 - August 6, 2006. Xinjiang, China.

入库方式： OAI收割

来源：长春光学精密机械与物理研究所

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