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Dynamic evaluation system for interpolation errors in the encoder of high precision (EI CONFERENCE)

文献类型：会议论文

作者Liang L.-H.; Sun Y.; Sun Y.; Wan Q.-H.
出版日期2009
会议名称4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 19, 2008 - November 21, 2008
会议地点Chengdu, China
关键词In order to measure dynamic interpolation errors of photoelectric encoder of high precision the dynamic evaluation system of interpolation errors is introduced. Firstly the fine Moire signal of encoder which is collected with the high-speed data gathering card into the computer is treated to equiangular data with the method of linear interpolation. Then the analysis of harmonic wave with the FFT is processed. Compared with the standard signal the dynamic interpolation errors of the encoder are calculated. Experimental results show that the precision of the dynamic evaluation system of interpolation errors is 0.1 %( pitch). The evaluation system is simple fast high precision and can be used in the working field of the encoder. 2009 SPIE.
收录类别EI
源URL[http://ir.ciomp.ac.cn/handle/181722/33843]  
专题长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式
GB/T 7714		 Liang L.-H.,Sun Y.,Sun Y.,et al. Dynamic evaluation system for interpolation errors in the encoder of high precision (EI CONFERENCE)[C]. 见:4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 19, 2008 - November 21, 2008. Chengdu, China.

入库方式： OAI收割

来源：长春光学精密机械与物理研究所

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