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Method for obtaining real temperature of space object by using the ratio of emissivity at different wavelengths (EI CONFERENCE)

文献类型：会议论文

作者Guo-Qiang W. ; Tao C. ; Jian-Li W.
出版日期2009
会议名称4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 19, 2008 - November 21, 2008
会议地点Chengdu, China
关键词The infrared radiation character (temperature and efficiency radiation area) of a space object is an important characteristic we can judge the state of the object working in orbit by measuring temperature and variety. Due to lower temperature of the object and far distance between the object and the earth the infrared radiation signal is faintness therefore temperature and the infrared radiation character is difficult to measure. There are several methods to measure the temperature of the object in theory and each one has its applicability respectively such as applying Wien Law to compute temperature based on Stefan-Bolzmann law to compute temperature and utilizing multi-spectrum detector to measure temperature As a whole these methods are based on the hypothesis that the object is a Black-body or the radiance emissivity is constant. In fact homochromatic radiance of object is not a constant but a function that changes with wavelength. Since the problem that an object whose homochromatic radiance s not a constant which results in temperature can not be computed accurately we bring forward a method to contrast the luminance of the object at different wavelengths and deduce the relationship among homochromatic radiance and wavelength and the temperature of Black-body from which we can compute real temperature of object. 2009 SPIE.
收录类别EI
源URL[http://ir.ciomp.ac.cn/handle/181722/33847]  
专题长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式
GB/T 7714		 Guo-Qiang W.,Tao C.,Jian-Li W.. Method for obtaining real temperature of space object by using the ratio of emissivity at different wavelengths (EI CONFERENCE)[C]. 见:4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 19, 2008 - November 21, 2008. Chengdu, China.

入库方式： OAI收割

来源：长春光学精密机械与物理研究所

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