Static micro-michelson interferometer based on electro-optical effect (EI CONFERENCE)
文献类型：会议论文
| 作者 | He X.
|
| 出版日期 | 2009 |
| 会议名称 | 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems, November 19, 2008 - November 21, 2008 |
| 会议地点 | Chengdu, China |
| 关键词 | Based on Electro-Optical (E-O) effect the interferometer is static and polarization-transparent. Using voltage scan to replace mechanical scan modulates the Optical Path Difference (OPD) without movement. Depending on the study of Tymon Barwicz MIT a special design makes the interferometer polarization-transparent. A method is given to compensate the optical dispersion of E-O material. In the end a spectrometer composed of this interferometer is in the 550nm band with spectral resolution up to 1 nanometer. 2009 SPIE. |
| 收录类别 | EI |
| 源URL | [http://ir.ciomp.ac.cn/handle/181722/33854]  |
| 专题 | 长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文 |
| 推荐引用方式 GB/T 7714 | He X.. Static micro-michelson interferometer based on electro-optical effect (EI CONFERENCE)[C]. 见:4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems, November 19, 2008 - November 21, 2008. Chengdu, China. |
入库方式： OAI收割
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