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Storage and compression design of high speed CCD (EI CONFERENCE)

文献类型：会议论文

作者Cai X. ; Zhai L. P.
出版日期2009
会议名称4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 19, 2008 - November 21, 2008
会议地点Chengdu, China
关键词In current field of CCD measurement large area and high resolution CCD is used to obtain big measurement image so that speed and capacity of CCD requires high performance of later storage and process system. The paper discusses how to use SCSI hard disk to construct storage system and use DSPs and FPGA to realize image compression. As for storage subsystem Because CCD is divided into multiplex output SCSI array is used in RAID0 way. The storage system is composed of high speed buffer DMA controller control MCU SCSI protocol controller and SCSI hard disk. As for compression subsystem according to requirement of communication and monitor system the output is fixed resolution image and analog PAL signal. The compression means is JPEG2000 standard in which 9/7 wavelets in lifting format is used. 2 DSPs and FPGA are used to compose parallel compression system. The system is composed of FPGA pre-processing module DSP compression module video decoder module data buffer module and communication module. Firstly discrete wavelet transform and quantization is realized in FPGA. Secondly entropy coding and stream adaption is realized in DSPs. Last analog PAL signal is output by Video decoder. Data buffer is realized in synchronous dual-port RAM and state of subsystem is transfer to controller. Through subjective and objective evaluation the storage and compression system satisfies the requirement of system. 2009 SPIE.
收录类别EI
源URL[http://ir.ciomp.ac.cn/handle/181722/33855]  
专题长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式
GB/T 7714		 Cai X.,Zhai L. P.. Storage and compression design of high speed CCD (EI CONFERENCE)[C]. 见:4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 19, 2008 - November 21, 2008. Chengdu, China.

入库方式： OAI收割

来源：长春光学精密机械与物理研究所

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