中国科学院机构知识库网格系统: Combination of skip-flat test with Ritchey-Common test for the large rectangular flat (EI CONFERENCE)

中国科学院机构知识库网格

Chinese Academy of Sciences Institutional Repositories Grid

Combination of skip-flat test with Ritchey-Common test for the large rectangular flat (EI CONFERENCE)

文献类型：会议论文


作者	Zhang L.; Xuan B.; Zhang L.
出版日期	2010
会议名称	5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010
会议地点	Dalian, China
关键词	The Skip-Flat test and Ritchey-Common test are the well-known methods for large flat mirrors measurement. This paper describes the theories of two methods. The combination of the Skip-Flat test with Ritchey-Common test is proposed. Simulations and experiments of the combination method for testing the large rectangular flat of high aspect ratio are shown. The results of the combination test and direct measurement are presented. In comparison of the methods the combination test is in good agreement with the direct measurement. 2010 Copyright SPIE - The International Society for Optical Engineering.
收录类别	EI
源URL	[http://ir.ciomp.ac.cn/handle/181722/33863]
专题	长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式 GB/T 7714	Zhang L.,Xuan B.,Zhang L.. Combination of skip-flat test with Ritchey-Common test for the large rectangular flat (EI CONFERENCE)[C]. 见:5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010. Dalian, China.

入库方式： OAI收割

来源：长春光学精密机械与物理研究所

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