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Modulation transfer function measurement of sampled imaging systems in field test (EI CONFERENCE)

文献类型：会议论文

作者Yang L.; Zhang J.; Zhang J.; Zhang J.; Wang J.; Sun Q.; Yang L.
出版日期2010
会议名称5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010
会议地点Dalian, China
关键词A digital mirror device (DMD) based light projector was developed as the target generator in modulation transfer function (MTF) measurement. In order to overcome the sampling-scene phase effect in MTF measurement of sampled imaging systems a method using random targets is introduced to yield a phase-averaged MTF. The main potential problem of implementing this method is the fact that the stationary assumption of the random targets may be vitiated in practical measurement especially in field test due to the ill condition. We provide an efficient model-independent way of analyzing and isolating the spectral contents arising from these additional contributions to MTF measurement. Algorithms with adaptive parameter selection were also developed for spectral estimation of the test image in order to overcome the challenge brought by the size limit of the test matrices for one certain field of view derived from the isoplantic region. The MTF measurement of a CCD video imager is used to demonstrate the measurement technique and illustrate the benefits over other methods. In order to validate the results comparisons have been made between MTF measurements of imager implemented using this method and bar target direct measurements. 2010 Copyright SPIE - The International Society for Optical Engineering.
收录类别EI
源URL[http://ir.ciomp.ac.cn/handle/181722/33877]  
专题长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式
GB/T 7714		 Yang L.,Zhang J.,Zhang J.,et al. Modulation transfer function measurement of sampled imaging systems in field test (EI CONFERENCE)[C]. 见:5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010. Dalian, China.

入库方式： OAI收割

来源：长春光学精密机械与物理研究所

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