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Study on dynamic imaging on TDI CCD optical remote sensor of push-broom technology (EI CONFERENCE)

文献类型：会议论文

作者Liu L.; Ren J.-Y.; Liu L.; Gao M.-H.
出版日期2010
会议名称5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010
会议地点Dalian, China
关键词A set special detecting system is proposed based on TDICCD push-broom technology applying in dynamic imaging detecting experiment of space optics remote sensor. In the system In the course of detecting push-broom movement of the satellite is simulated through using double supporting U structure precision rotary platform with remote sensor by angular speed 0.555/s regard Nyquist frequency target as detecting aim within the range of 5 and control precision on steady speed achieves 0.3% in order to solve matching uncertainty between the CCD pixel and the vertical target strip image when the remote sensor does push-broom make matching simplify enhance the measurement result the accuracy. So the tolerance a/n arithmetic progression gap target strip is joined in each group of rectangular vertical group target strip. The remote sensor obtains in vertical the level and 45 the direction 0 fields of view 0.86 the field of view Nyquist frequency target strip image after detected a group target strip which can precision matching to TDICCD pixel at least can be obtained through analysis and dealing with 0.86 field of view's target strip image. The experiment not only verifies the detecting system's feasibility but simultaneously verifies whether to have the high quality dynamic imaging quality when TDICCD push-broom technology is adopted on the remote sensor developed. 2010 Copyright SPIE - The International Society for Optical Engineering.
收录类别EI
源URL[http://ir.ciomp.ac.cn/handle/181722/33889]  
专题长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式
GB/T 7714		 Liu L.,Ren J.-Y.,Liu L.,et al. Study on dynamic imaging on TDI CCD optical remote sensor of push-broom technology (EI CONFERENCE)[C]. 见:5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010. Dalian, China.

入库方式： OAI收割

来源：长春光学精密机械与物理研究所

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