中国科学院机构知识库网格系统: Super-resolved imaging system with oversampling technology (EI CONFERENCE)

中国科学院机构知识库网格

Chinese Academy of Sciences Institutional Repositories Grid

Super-resolved imaging system with oversampling technology (EI CONFERENCE)

文献类型：会议论文


作者	Zhang X.; Wang L.-J.; Wang L.-J.; Zhang J.-P.; Liu Y.; Liu Y.; Liu Y.; Zhang X.; Zhang X.
出版日期	2007
会议名称	3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies, AOMATT 2007: Advanced Optical Manufacturing Technologies, July 8, 2007 - July 12, 2007
会议地点	Chengdu, China
关键词	It has been a significant issue in the imaging filed to provide the highest possible resolution of an electro-optical imaging system(E-O imaging system). CCD arrays are inherently undersampled and spatial frequency above Nyquist frequency is distorted so as to create ambiguity and Moire patterns for targets imaged by E-O system.. As to this drawback a system-design project is introduced and discussed in the paper. It's well known that many image quality metrics are linked to MTF. However CCDs don't satisfy MTF condition namely the shift-invariant property so MTF synthesis can't appraise the whole system simply by the MTF product of the few sub-system ones in E-O imaging system. Then it is depicted how to solve this problem in the following. Finally the analyses and comparisons of the imaging performance parameters with and without super-resolved technologies are shown.
收录类别	EI
源URL	[http://ir.ciomp.ac.cn/handle/181722/33911]
专题	长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式 GB/T 7714	Zhang X.,Wang L.-J.,Wang L.-J.,et al. Super-resolved imaging system with oversampling technology (EI CONFERENCE)[C]. 见:3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies, AOMATT 2007: Advanced Optical Manufacturing Technologies, July 8, 2007 - July 12, 2007. Chengdu, China.

入库方式： OAI收割

来源：长春光学精密机械与物理研究所

浏览0

下载0

收藏0

其他版本

除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。