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Earth elevation map production and high resolution sensing camera imaging analysis (EI CONFERENCE)

文献类型：会议论文

作者Dai L.
出版日期2010
会议名称Optoelectronic Imaging and Multimedia Technology, October 18, 2010 - October 20, 2010
会议地点Beijing, China
关键词The Earth's digital elevation which impacts space camera imaging has prepared and imaging has analysed. Based on matching error that TDI CCD integral series request of the speed of image motion statistical experimental methods-Monte Carlo method is used to calculate the distribution histogram of Earth's elevation in image motion compensated model which includes satellite attitude changes orbital angular rate changes latitude longitude and the orbital inclination changes. And then elevation information of the earth's surface from SRTM is read. Earth elevation map which produced for aerospace electronic cameras is compressed and spliced. It can get elevation data from flash according to the shooting point of latitude and longitude. If elevation data between two data the ways of searching data uses linear interpolation. Linear interpolation can better meet the rugged mountains and hills changing requests. At last the deviant framework and camera controller are used to test the character of deviant angle errors TDI CCD camera simulation system with the material point corresponding to imaging point model is used to analyze the imaging's MTF and mutual correlation similarity measure simulation system use adding cumulation which TDI CCD imaging exceeded the corresponding pixel horizontal and vertical offset to simulate camera imaging when stability of satellite attitude changes. This process is practicality. It can effectively control the camera memory space and meet a very good precision TDI CCD camera in the request matches the speed of image motion and imaging. 2010 SPIE.
收录类别EI
源URL[http://ir.ciomp.ac.cn/handle/181722/33944]  
专题长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式
GB/T 7714		 Dai L.. Earth elevation map production and high resolution sensing camera imaging analysis (EI CONFERENCE)[C]. 见:Optoelectronic Imaging and Multimedia Technology, October 18, 2010 - October 20, 2010. Beijing, China.

入库方式： OAI收割

来源：长春光学精密机械与物理研究所

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