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The registration of aerial infrared and visible images (EI CONFERENCE)

文献类型：会议论文

作者Liu J.; Wang Y.; Wang Y.; Wang Y.; Wang Y.; Wang Y.; Liu J.; Liu J.
出版日期2010
会议名称2010 International Conference on Educational and Information Technology, ICEIT 2010, September 17, 2010 - September 19, 2010
会议地点Chongqing, China
关键词In order to solve the registration problem of different source image existed on aerial image fusion algorithms based on Particle Swarm Optimization (PSO) are applied as search strategy in this paper and Alignment Metric (AM) is used as judgment. This study has realized the different source image registration of infrared and visible light with high speed high accuracy and high reliability. Basically with little restriction of gray level properties a new alignment measure is applied which can efficiently measure the image registration extent and tolerate noise well. Even more the intelligent optimization algorithm - Particle Swarm Optimization (PSO) is combined to improve the registration precision and rate of infrared and visible light. Experimental results indicate that the study attains the registration accuracy of pixel level and every registration time is cut down over 40 percent compared to traditional method. The match algorithm based on AM solves the registration problem that greater differences between different source images are existed on gray and characteristic. At the same time the adoption of combining the intelligent optimization algorithms significantly improves the searching efficiency and convergence speed of the algorithms and the registration result has higher accuracy and stability which builds up solid foundation for different source image fusion. The method in this paper has a magnificent effect and is easy for application and very suitable for engineering use. 2010 IEEE.
页码V1438-V1442
收录类别EI
源URL[http://ir.ciomp.ac.cn/handle/181722/33960]  
专题长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式
GB/T 7714		 Liu J.,Wang Y.,Wang Y.,et al. The registration of aerial infrared and visible images (EI CONFERENCE)[C]. 见:2010 International Conference on Educational and Information Technology, ICEIT 2010, September 17, 2010 - September 19, 2010. Chongqing, China.

入库方式： OAI收割

来源：长春光学精密机械与物理研究所

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