中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Influence of the side-Ohmic contact processing on the polarization Coulomb field scattering in AlGaN/AlN/GaN heterostructure field-effect transistors

文献类型:期刊论文

作者Luan CB (Luan, Chongbiao) ; Lin ZJ (Lin, Zhaojun) ; Lv YJ (Lv, Yuanjie) ; Meng LG (Meng, Lingguo) ; Yu YX (Yu, Yingxia) ; Cao ZF (Cao, Zhifang) ; Chen H (Chen, Hong) ; Wang ZG (Wang, Zhanguo)
刊名applied physics letters
出版日期2012
卷号101期号:11页码:113501
学科主题半导体材料
收录类别SCI
语种英语
公开日期2013-03-27
源URL[http://ir.semi.ac.cn/handle/172111/23828]  
专题半导体研究所_中科院半导体材料科学重点实验室
推荐引用方式
GB/T 7714
Luan CB ,Lin ZJ ,Lv YJ ,et al. Influence of the side-Ohmic contact processing on the polarization Coulomb field scattering in AlGaN/AlN/GaN heterostructure field-effect transistors[J]. applied physics letters,2012,101(11):113501.
APA Luan CB .,Lin ZJ .,Lv YJ .,Meng LG .,Yu YX .,...&Wang ZG .(2012).Influence of the side-Ohmic contact processing on the polarization Coulomb field scattering in AlGaN/AlN/GaN heterostructure field-effect transistors.applied physics letters,101(11),113501.
MLA Luan CB ,et al."Influence of the side-Ohmic contact processing on the polarization Coulomb field scattering in AlGaN/AlN/GaN heterostructure field-effect transistors".applied physics letters 101.11(2012):113501.

入库方式: OAI收割

来源:半导体研究所

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