中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
A New Method for Measuring the Frequency Response of Broadband Optoelectronic Devices

文献类型:期刊论文

作者Wu XM (Wu, Xuming) ; Man JW (Man, Jiangwei) ; Xie L (Xie, Liang) ; Liu JG (Liu, Jianguo) ; Liu Y (Liu, Yu) ; Zhu NH (Zhu, Ninghua)
刊名ieee photonics journal
出版日期2012
卷号4期号:5页码:1679-1685
学科主题光电子学
收录类别SCI
语种英语
公开日期2013-03-27
源URL[http://ir.semi.ac.cn/handle/172111/23819]  
专题半导体研究所_集成光电子学国家重点实验室
推荐引用方式
GB/T 7714
Wu XM ,Man JW ,Xie L ,et al. A New Method for Measuring the Frequency Response of Broadband Optoelectronic Devices[J]. ieee photonics journal,2012,4(5):1679-1685.
APA Wu XM ,Man JW ,Xie L ,Liu JG ,Liu Y ,&Zhu NH .(2012).A New Method for Measuring the Frequency Response of Broadband Optoelectronic Devices.ieee photonics journal,4(5),1679-1685.
MLA Wu XM ,et al."A New Method for Measuring the Frequency Response of Broadband Optoelectronic Devices".ieee photonics journal 4.5(2012):1679-1685.

入库方式: OAI收割

来源:半导体研究所

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