中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Improved thermal and electrical properties of nitrogen-doped Ge-rich Ge3Sb2Te5 for phase-change memory application

文献类型:期刊论文

作者Cheng, LM ; Wu, LC ; Song, ZT ; Rao, F ; Peng, C ; Yao, DN ; Liu, B
刊名MATERIALS LETTERS
出版日期2012
卷号71页码:98-100
关键词Phase-change memory Activation energy Electrical properties Phase transformation
ISSN号0167-577X
通讯作者Cheng, LM (reprint author), Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Lab Nanotechnol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China.
中文摘要The thermal and electrical-property changes of 2.02 at.% nitrogen-doped Ge-rich Ge3Sb2Te5 (NGST) were investigated. The crystallization temperature was 180 degrees C. The corresponding activation energy was 2.96 eV. The maximum temperature for a 10 year d
学科主题Materials Science; Physics
收录类别2012SCI-161
原文出处10.1016/j.matlet.2011.12.039
语种英语
公开日期2013-04-17
源URL[http://ir.sim.ac.cn/handle/331004/114784]  
专题上海微系统与信息技术研究所_功能材料与器件_期刊论文
推荐引用方式
GB/T 7714
Cheng, LM,Wu, LC,Song, ZT,et al. Improved thermal and electrical properties of nitrogen-doped Ge-rich Ge3Sb2Te5 for phase-change memory application[J]. MATERIALS LETTERS,2012,71:98-100.
APA Cheng, LM.,Wu, LC.,Song, ZT.,Rao, F.,Peng, C.,...&Liu, B.(2012).Improved thermal and electrical properties of nitrogen-doped Ge-rich Ge3Sb2Te5 for phase-change memory application.MATERIALS LETTERS,71,98-100.
MLA Cheng, LM,et al."Improved thermal and electrical properties of nitrogen-doped Ge-rich Ge3Sb2Te5 for phase-change memory application".MATERIALS LETTERS 71(2012):98-100.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

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